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Category |
Contents |
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Semiconductor |
・ILD, STI, W, Cu damascene process ・Low-K material evaluation ・Consumables development & evaluation such as Slurry, Pad, and Conditioner ・TSV |
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SiC |
・Super-surface-finish CMP |
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MEMS |
・TSV ・Insulation layer planarization, Sacrifice layer planarization, etc. |
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FPD |
・ITO surface-finish, Resin-film planarization and etc. |
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PCB |
・Circuit print layer, Insulation layer and etc. |
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Others |
・Miscellaneous substrate, Oxidized film, Metal film planarization, Surface-finish |